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  1. Foothill Instruments

    Foothill Instruments manufactures thick film metrology systems.
    instrument2
    measurement2
    polymer2
    silicon2
    metrology2
    oxide1
    spectrometer1
    thin film1
    BCB1
    dielectric1
    resist1
    polyimide1
    nitride1
    interferometry1
    photoresist1
    polysilicon1
    thick film1
    uniformity1
    refractive index1
    film thickness1
    ellipsometry1
    reflectivity1
    amorphous silicon1
    low-k1
    spin-on1
    SU-81
    wafer thinning1
    oxynitride1
    backgrind1
    silicide1
    a-silcon0

    www.foothill-instruments.com - 2009-02-06

  2. Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with ...

    Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1
    thin film metrology tools0

    www.sci-soft.com - 2009-02-07

  3. Scientific Computing International - FilmTek Instruments

    FilmTek™ 2000SE - Spectroscopic Ellipsometer. Based on a rotating compensator design, the FilmTek™ 2000SE combines spectroscopic ellipsometry with normal inc ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    spectrophotometer1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1

    www.sciinstruments.com - 2009-02-07

  4. Metricon Prism Coupler Instruments

    Metricon Corporation has pioneered the practical application of prism coupling technology to problems of thin film, bulk material, and optical waveguide ...
    index3
    Inc.3
    optical2
    polymers2
    waveguide1
    thin film1
    spr1
    refractive1
    biosensor1
    refractometer1
    plasmon1
    Abbe1
    film thickness1
    ellipsometer1
    ellipsometry1
    surface plasmon resonance1
    birefringence1
    thin film thickness1
    Metricon1
    Abbe refractometer1
    Sairon1
    prism coupler0
    prism coupling0
    Sairon technolgy0
    Sairon technology0
    VAMFO0
    waveguide loss0

    www.metricon.com - 2009-02-15

  5. veonis Technologies

    veonis Technologies: A European sales and service organization in the semiconductor industry
    germany3
    munich2
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    metrology2
    mps1
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    cde1
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    interferometer1
    mark ii1
    characterisation1
    film thickness1
    ion source1
    ellipsometry1
    advanced process control1
    ion beam1
    ion assisted deposition1
    back grinding1
    four point probe1
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    commonwealth scientific0
    gate oxide monitoring0
    gridless ion source0
    ion assist0
    its gmbh0
    its intertrade scientific gmbh0

    www.veonis.com - 2009-02-07

  6. Ellipsometers from HORIBA Jobin Yvon

    HORIBA Jobin Yvon ellipsometers combine two key elements: phase modulation and an entirely numerical data acquisition and processing system. It allows real-time ...
    film5
    delta2
    polymer2
    psi2
    kinetic1
    multilayer1
    thin film1
    kinetics1
    thickness1
    multi-layer1
    polarisation1
    refractive index1
    film thickness1
    thin-film1
    Ellipsometer1
    ellipsometry1
    spectroscopic1
    polarized light1
    single layer1
    multiple layers1
    thin film characterisation1
    liquid film1
    polarised light1
    langmuir blodgett1
    variable angle1
    liquid thin film1
    liquid thin-films1
    polymeric characterisation1
    thin-film characterisation1
    thin-film thickness1
    thin film tickness1

    www.ellipsometer.co.uk - 2009-02-08

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